Ιδρυματικό Αποθετήριο
Πολυτεχνείο Κρήτης
Πολυτεχνείο Κρήτης
EN
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| URI: | http://purl.tuc.gr/dl/dias/BE7DEB09-9F56-4BC9-BC4D-A851F5EEC6B9 | ||
| Έτος | 1976 | ||
| Τύπος | Δημοσίευση σε Περιοδικό με Κριτές | ||
| Άδεια Χρήσης |
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| Βιβλιογραφική Αναφορά | A. Katsanos, A. Xenoulis, A. Hadjiantoniou and R. W. Fink, "An external beam technique for proton-induced X-ray emission analysis", Nucl. Instrum. Meth., vol. 137, no. 1, pp. 119-124, Aug. 1976. doi: 10.1016/0029-554X(76)90256-1 https://doi.org/10.1016/0029-554X(76)90256-1 | ||
| Εμφανίζεται στις Συλλογές |
A method for proton irradiation of targets in free air is described. A 7.6 μm beryllium foil used as a proton exit window causes negligible energy loss for as low as 2 MeV protons and can withstand relatively high currents for extended periods of time without vacuum problems. Proton-induced X-rays from thin and thick samples are detected using Si(Li) and intrinsic Ge detectors A detailed comparison of X-ray spectra obtained both with external and internal bombardment, for a variety of samples, is presented and these results clearly demonstrate the superior performance of the external beam technique for elemental micro-analysis.
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